We are a worldwide leader in the design, development and manufacture of advanced wafer probing solutions for the electrical measurement and test of semiconductor integrated circuits and chips. Our customers use our products to perform testing of chips while in wafer form, or wafer probing, in both engineering and production test environments. Our engineering probe stations and analytical probes are used in research and development to perform precise electrical measurements, or electrical metrology, on increasingly complex and high speed chips in order to assure quality and reliability, reduce costly redesigns, accelerate time-to-market and improve chip fabrication processes. We derive a large majority of our revenue from the sale of our engineering probe stations. Our production probe cards reduce manufacturing costs of complex and high speed chips by identifying defective chips early in the process and by testing multiple chips concurrently.
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